Radiology department, Institute of Medical Technology- Baghdad, Middle Technical University, Iraq.
Abstract
Thermal evaporation was used to create pure CdS thin films, which were then analyzed using XRD and UV-VIS spectroscopy. With changes in thickness, it was discovered that the particle size decreased from 23.6 nm to 21.7 nm. From the XRD data, the impact of thickness on strain and dislocation has been estimated. To determine how optical characteristics changed as thickness changed, transmission data were examined in the 200–1100 nm spectral range. Additionally, it was found that as thickness increased, between 2.444 and 2.401 eV, the band gap decreased.Thermal evaporation was used to create pure CdS thin films, which were then analyzed using XRD and UV-VIS spectroscopy. With changes in thickness, it was discovered that the particle size decreased from 23.6 nm to 21.7 nm. From the XRD data, the impact of thickness on strain and dislocation has been estimated. To determine how optical characteristics changed as thickness changed, transmission data were examined in the 200–1100 nm spectral range. Additionally, it was found that as thickness increased, between 2.444 and 2.401 eV, the band gap decreased.
)