[1] H. Oshima, H. Kikuchi, H. Nakao, T. Morikawa, K. Matsumoto, K. Nishio, H. Masuda, K. Itho, Japanese Journal of Applied Physics 44 (2005) L1355.
[2] I.Bakonyi,L.Pe´ter, Progressin Materials Science 55 (2010) 107-112.
[3] E.C. Walter, R.M. Penner, H. Liu, K.H. Ng, M.P. Zach, F. Favier, Surface and Interface Analysis 34 (2002) 409-416.
[4] A. Chelnokov, S. David, K. Wang, F. Marty, J.M. Lourtioz, IEEE Journal of Selected Topics in Quantum Electronics 8 (2002) 919-925.
[5] J.X. Xu, K.Y. Wang, Y. Xu, Chemistry Letters 36 (2007) 868-875.
[6] M.B. Jeong, S. Martin, M. Martin, Journal of Physical Chemistry C 112 (2008) 2252-2260.
[7] X. Liu, J. Zhao, Y. Li, S. Xu, Z. Zhu, J. Chen, G. Wu, Chem. Lett. 36 (2007) 166-173.
[8] G.B. Ji, W. Chen, S.L. Tang, B.X. Gu, Z. Li, Y.W. Du, Solid State Commun. 130 (2004) 541-550.
[9] S. Shamailaa, R. Sharif, S. Riaz, M. Ma, M. Khaleeq-ur-Rahmanb, X.F. Han, J.
Magn.Magn.Mater.320 (2008) 1803-1810.
[10] Y. Dahmane, L. Cagnon, J. Voiron, S. Pairis, M. Bacia, L. Ortega, N. Benbrahim, A. Kadri, J. Phys. D: Appl. Phys. 39 (2006) 4523-4530.
[11] M. Almasi Kashi, A. Ramazani, F. AdelniaNajafabadi, Z. Heydari, J. Applied Surface Science. 257 (2011) 9347-9355.
[12] M. Almasi Kashi, A. Ramazani, F. AdelniaNajafabadi, Journal of Alloys And Compounds. 540 (2012) 133-139.